Area scan sensor "Flying Spot Scanner"
No XY stage needed! Thickness and distance (displacement) measurement possible using the principle of spectral interference! Also suitable for wafer inspection applications.
The "Flying Spot Scanner" is a scanner that combines spectral interference measurement technology with a high-speed scanning system. It can perform high-speed scans of a diameter of 80mm, suitable for offline, inline, and quality control applications. It allows for easy inspection of target areas with definable scanning shapes and filters. Additionally, it can achieve good results even on reflective surfaces. 【Features】 ■ Ultra-fast optical scanning ■ The measurement object and optical sensor are fixed ■ No XY stage required ■ Thickness and distance (displacement) measurement based on spectral interference principles *For more details, please refer to the PDF document or feel free to contact us.
- Company：プレシテック・ジャパン
- Price：Other
